Ground and VCC Bounce of High-Speed Integrated Circuits 下载

Ground and VCC Bounce of High-Speed Integrated Circuits

The purpose of this paper is to give a general
des cription of what ground and VCC bounce
are, why it is they are tested, and a detailed
des cription of how they are tested.
WHY SHOULD GROUND AND VCC
BOUNCE BE TESTED?
Ground and VCC bounce testing is done to
evaluate what effect switching more than one
output simultaneously has on the
performance of the integrated circuit. This
effect becomes important in any
high-performance line of circuits because the
propagation delays and output edge rates are
very fast. This can cause ground bounce and
VCC bounce, described as Voltage Output
Low Peak (VOLP) and Voltage Output High
Valley (VOHV), respectively.
Fast edge rates of the output drivers can
team up with internal parasitic lead
inductance and the output load to produce
unwanted side effects of noise on the
outputs. This noise or ringing will occur on
both a static and a switching output. This
ringing can be substantial enough to cross
the input triggering threshold of a subsequent
device, which in turn can cause a system to
perform unpredictably and unreliably.